A competitive award from the U.S. Air Force Office of Scientific Research will enable TeraProbes, Inc. to develop non-contact probing of electronic devices and chips at mmW and THz frequencies under extreme vacuum and temperature. Space… here comes TeraProbes!
We are excited to expand our collaboration with U.S. National Institute of Standards and Technology (NIST) by permanently housing one of our units on site. RF-Electronics Group at NIST has been enthusiastically collaborating with our team under a NIST-TeraProbes CRADA past few years. Today, TeraProbes, Inc. is delighted to solidify our collaboration by housing a non-contact probe station permanently at NIST.
TeraProbes, Inc. manufactures innovative, non-contact metrology systems for on-wafer device and IC characterization. Our fully-automated contact-free probe stations eliminate the wear-and-tear and contact-repeatability issues that users face with analytical contact-probes. Our non-contact probing systems readily cover 50GHz-1.1THz band for single-mode and pure differential-mode characterization. Our fully-automated probe stations enable uninterrupted characterization of entire wafers. See the full movie at: https://www.youtube.com/watch?v=XXRExJ7wXBk
TeraProbes, Inc. and C&K Technologies announced today that they have formed a Solution Partnership to bring the innovative non-contact probing technology to researchers and practitioners in Korea. Under the partnership, C&K Technologies will provide the sales and service support for TeraProbes, Inc.’s non-contact probe station line and will be the first point of contact in Korea. “We are extremely excited to join forces with C&K Tech to offer our products to the electronics industry in Korea. Being a major electronics manufacturing hub, Korea presents a unique opportunity for major cost savings in the testing of devices and wafers for mmW and THz-frequency applications.”, said Kubilay Sertel, President of TeraProbes, Inc. C&K Tech is a leading supplier of affordable, high-performance test and measurement instrumentation for RF, microwave, mmW and THz applications in Korea (www.cnk-tek.com). TeraProbes, Inc. manufactures innovative, non-contact metrology systems for on-wafer device and IC characterization. Our fully-automated contact-free probe stations eliminate the wear-and-tear and contact-repeatability issues that users face with analytical contact-probes. Our non-contact probing systems readily cover 50GHz-1.1THz band for single-mode and pure differential-mode characterization. Our fully-automated probe stations enable uninterrupted characterization of entire wafers.
TeraProbes, Inc. and RAM N.S Technologies announced today that they have formed a Solution Partnership to bring the innovative non-contact probing technology to researchers and practitioners in Israel. Under the partnership, RAM-TECH will provide the sales and service support for TeraProbes, Inc.’s non-contact probe station line and will be the first point of contact in Israel. “We are delighted and very excited to offer our products to researchers and engineers in Israel, where there is clear and growing interest and research in the millimeter-wave and terahertz frequency applications”, said Kubilay Sertel, President of TeraProbes, Inc. RAM N.S Technologies is one of the top Israeli Distributors / Representatives and Integrators for systems, subsystems and components, with Partners and Vendors from USA, Europe and The Far East. By supplying standard & semi-custom components, design & engineering services RAM-TECH has become a strategic supplier in the Israeli market for all major customers, with excellent technical and commercial skills in RF, Microwave, Photonic (Electro-Optic & Fiber-Optic), Semiconductor, PCB, Cellular, Embedded, ASIC and IPs. TeraProbes, Inc. manufactures innovative, non-contact metrology systems for on-wafer device and IC characterization. Our fully-automated contact-free probe stations eliminate the wear-and-tear and contact-repeatability issues that users face with analytical contact-probes. Our non-contact probing systems […]
TeraProbes, Inc. is proud to announce that our Non-contact Probe Stations are now compatible with Rodhe & Schwarz ZVA-24 VNAs and ZCxxx-line Frequency Converters. The photo is a close-up of the R&S ZVA-24 VNA with ZC330 Frequency Converters, working in concert with our TP-100-A8025 Non-contact Probe Station, where the Smith chart shows the real-time response of the reflection coefficient from an on-wafer offset-short standard for the 220-330GHz band, along with the expected result in red. Pretty darn close! Sit back, relax and let our automated probing systems do the work for you. Accurate and reliable results, with “out-of-this-world” on-wafer repeatability.
TeraProbes, Inc. and Mercury Tech, Ltd. announced today that they have formed an Exclusive Partnership to bring the innovative non-contact probing technology to researchers and practitioners in China. Under the new partnership, Mercury Tech will provide the sales and service support for TeraProbes, Inc.’s non-contact probe station line and will be the first point of contact in China. Mercury Tech is a private company, founded in 2010 in Chengdu, PRC. It’s key mission is the development of Terahertz technology and solutions. Mercury Tech has been the major vendor in China market after over 5 years growth, providing an important bridge of Terahertz technology collaboration and communication between Europe, Japan and China. A unique offering of Mercury Tech is to provide Terahertz solutions based on two complementary methods: Solid-State Electronics and Photonics. “Our Terahertz solution has covered from basic materials to turn-key product. Our customers focus on the field of education, manufacture and aerospace. We are working with our would-class partners to do more towards the large-scale industrial operations and technology collaboration on the Terahertz field, and we are very excited to collaborate with TeraProbes, Inc. to offer their innovative non-contact on-wafer metrology systems in China.”, said Aeon Zhang, the General Director of Mercury Tech. TeraProbes, Inc. manufactures innovative, non-contact […]
We will be at Booth #1253 at the 2018 IMS Exhibit in Philadelphia with a live demo of our automated non-contact probe station. Millimeter-wave and Terahertz-frequency on-wafer probing has never been so easy and effective. Witness the future of on-wafer probing with TeraProbes, Inc. In addition, we will unveil a surprise new product that will shake up analytic probing industry. Curious? Stop by Booth #1253 and find out.