TeraProbes, Inc. manufactures innovative, non-contact metrology systems for on-wafer device and IC characterization. Our fully-automated contact-free probe stations eliminate the wear-and-tear and contact-repeatability issues that users face with analytical contact-probes. Our non-contact probing systems readily cover 50GHz-1.1THz band for single-mode and pure differential-mode characterization. Our fully-automated probe stations enable uninterrupted characterization of entire wafers. See the full movie at: https://www.youtube.com/watch?v=XXRExJ7wXBk