March 24, 2018 – TeraProbes Inc

We will be at Booth #1253 at the 2018 IMS Exhibit in Philadelphia with a live demo of our automated non-contact probe station. Millimeter-wave and Terahertz-frequency on-wafer probing has never been so easy and effective. Witness the future of on-wafer probing with TeraProbes, Inc. In addition, we will unveil a surprise new product that will shake up analytic probing industry. Curious? Stop by Booth #1253 and find out.

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Posts in March 24, 2018

Booth #1253: Visit us at the IMS 2018 Exhibit in Philly (June 12-14, 2018)