May 4, 2015 – TeraProbes Inc

TeraProbes will unveil a fully-automated wafer-scale mmW and THz characterization system at our Booth#634 at the IMS Exhibit in Phoenix, AZ. View exhibition floor plan here. – Contact us (contact@teraprobes.com) to schedule a meeting with TeraProbes representatives.

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Posts in May 4, 2015

The next big thing in wafer testing is finally here – Visit TeraProbes at 2015 IMS Exhibition