TeraProbes and AmTechs team up to offer Non-contact Probing Solutions in Japan

Home / TeraProbes and AmTechs team up to offer Non-contact Probing Solutions in Japan

TeraProbes, Inc. and AmTechs, Corp. announced today that they have formed a Solution Partnership to bring the innovative non-contact probing technology to researchers and practitioners in Japan.

Under the partnership, AmTechs will provide the sales and service support for TeraProbes, Inc.’s non-contact probe station line and will be the first point of contact in Japan.

TeraProbes, Inc. manufactures innovative, non-contact metrology systems for on-wafer device and IC characterization. Our fully-automated contact-free probe stations eliminate the wear-and-tear and contact-repeatability issues that users face with analytical contact-probes. Our non-contact probing systems readily cover 55GHz-1.1THz band for single-mode and pure differential-mode characterization. Our fully-automated probe stations enable uninterrupted characterization of entire wafers. For more information, please visit: www.teraprobes.com

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